Name
Abstract | ||
|---|---|---|
The STT-MRAM manufacturing process involves not only traditional CMOS process steps, but also the integration of magnetic tunnel junction (MTJ) devices, the data-storing elements. This paper demonstrates a paradigm shift in fault modeling for STT-MRAMs by performing defect modeling and fault analysis for MTJ pinhole defects which are seen as a key type of STT-MRAM manufacturing defects. A Verilog-A compact model for defect-free MTJ devices is built and calibrated with electrical measurements on actual MTJ wafers. MTJs with a pinhole defect are extensively characterized, both during manufacturing test (t=0) and in the field (t>0), and the data is used to extend our defect-free MTJ compact model to include parameterized pinhole defects. The model is then used to perform single-cell static fault analysis and this shows not only what kind of faults can occur in an STT-MRAM, but also that the conventional fault modeling approach based on linear resistors cannot catch such behavior. |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/ETS.2019.8791518 | 2019 IEEE European Test Symposium (ETS) |
Keywords | Field | DocType |
Verilog-A compact model,defect-free MTJ devices,manufacturing test,defect-free MTJ compact model,parameterized pinhole defects,single-cell static fault analysis,pinhole defect characterization,STT-MRAM testing,STT-MRAM manufacturing process,magnetic tunnel junction devices,data-storing elements,paradigm shift,MTJ pinhole defects,STT-MRAM manufacturing defects,CMOS process,fault modeling approach,MTJ wafers,electrical measurements,linear resistors | Wafer,Fault analysis,Fault modeling,Computer science,Electrical measurements,Magnetoresistive random-access memory,Electronic engineering,Resistor,Tunnel magnetoresistance,Manufacturing process | Conference |
ISSN | ISBN | Citations |
1530-1877 | 978-1-7281-1174-2 | 0 |
PageRank | References | Authors |
0.34 | 8 | 9 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Lizhou Wu | 1 | 7 | 0.80 |
| Siddharth Rao | 2 | 11 | 2.23 |
| Guilherme Cardoso Medeiros | 3 | 6 | 3.59 |
| Mottaqiallah Taouil | 4 | 224 | 33.40 |
| Erik Jan Marinissen | 5 | 2053 | 170.58 |
| Farrukh Yasin | 6 | 0 | 0.68 |
| S. Couet | 7 | 1 | 1.70 |
| Said Hamdioui | 8 | 887 | 118.69 |
| G. Kar | 9 | 9 | 6.91 |