Name
Affiliation
Papers
MOTTAQIALLAH TAOUIL
Delft University of Technology, CD Delft, The Netherlands
78
Collaborators
Citations 
PageRank 
134
224
33.40
Referers 
Referees 
References 
415
1057
559
Search Limit
1001000
Title
Citations
PageRank
Year
Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron00.342021
Evaluation Of Single Event Upset Susceptibility Of Finfet-Based Srams With Weak Resistive Defects00.342021
Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks00.342021
Applying Thermal Side-Channel Attacks on Asymmetric Cryptography10.382021
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs10.432021
Hard-to-Detect Fault Analysis in FinFET SRAMs00.342021
Protecting IoT Devices through a Hardware-driven Memory Verification00.342021
Skeleton-based Synthesis Flow for Computation-In-Memory Architectures00.342020
A Security Verification Template to Assess Cache Architecture Vulnerabilities00.342020
RNN-Based Detection of Fault Attacks on RSA00.342020
LiD-CAT: A Lightweight Detector for Cache ATtacks00.342020
eSRAM Reliability: Why is it still not optimally solved?00.342020
The Power of Computation-in-Memory Based on Memristive Devices10.352020
Modeling Static Noise Margin for FinFET based SRAM PUFs00.342020
Testing Scouting Logic-Based Computation-in-Memory Architectures20.382020
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects00.342020
A Classification of Memory-Centric Computing30.372020
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems00.342020
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs20.372020
G-PUF: An Intrinsic PUF Based on GPU Error Signatures00.342020
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level20.502020
S-NET - A Confusion Based Countermeasure Against Power Attacks for SBOX.00.342020
Testing Computation-in-Memory Architectures Based on Emerging Memories10.362019
Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM10.372019
A computation-in-memory accelerator based on resistive devices20.362019
System-Level Sub-20 Nm Planar And Finfet Cmos Delay Modelling For Supply And Threshold Voltage Scaling Under Process Variation00.342019
Hardware-Based Aging Mitigation Scheme for Memory Address Decoder00.342019
Methodology for Application-Dependent Degradation Analysis of Memory Timing10.372019
Challenges and Solutions in Emerging Memory Testing70.522019
Software-Based Mitigation for Memory Address Decoder Aging00.342019
Time-Division Multiplexing Automata Processor00.342019
Applications of Computation-In-Memory Architectures based on Memristive Devices30.402019
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing00.342019
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs10.392019
Reliability Modeling and Mitigation for Embedded Memories00.342019
Device-Aware Test: A New Test Approach Towards DPPB Level20.372019
Energy Optimization For Large-Scale 3d Manycores In The Dark-Silicon Era00.342019
Enhanced Scouting Logic: A Robust Memristive Logic Design Scheme00.342019
Memory and Communication Profiling for Accelerator-Based Platforms.00.342018
Impact and mitigation of SRAM read path aging.00.342018
Ionizing radiation modeling in DRAM transistors00.342018
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs.10.382018
Memristive Devices For Computation-In-Memory00.342018
Testing Resistive Memories: Where are We and What is Missing?20.372018
Electrical Modeling of STT-MRAM Defects70.472018
A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar.40.482018
Degradation analysis of high performance 14nm FinFET SRAM10.372018
Interconnect networks for resistive computing architectures00.342017
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier.70.622017
On the Implementation of Computation-in-Memory Parallel Adder.40.392017
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