Paper Info
Title
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems
Abstract
The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These set tough requirements on mutually dependent extra-functional design aspects. The H2020 MSCAITN project RESCUE is focused on key challenges for reliability, security and quality, as well as related electronic design automation tools and methodologies. The objectives include both research advancements and cross-sectoral training of a new generation of interdisciplinary researchers. Notable interdisciplinary collaborative research results for the first halfperiod include novel approaches for test generation, soft-error and transient faults vulnerability analysis, cross-layer fault-tolerance and error-resilience, functional safety validation, reliability assessment and run-time management, HW security enhancement and initial implementation of these into holistic EDA tools.
Year
DOI
Venue
2020
10.23919/DATE48585.2020.9116558
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Keywords
DocType
ISSN
reliability,security,test,fault tolerance,EDA tools
Conference
1530-1591
ISBN
Citations 
PageRank 
978-1-7281-4468-9
0
0.34
References 
Authors
0
18
Name
Order
Citations
PageRank
Maksim Jenihhin17025.02
Said Hamdioui2887118.69
Reorda, M.S.338839.51
Milos Krstic417039.42
Peter Langendoerfer522925.02
Sauer Christian600.34
Klotz Anton700.34
Huebner Michael800.34
Nolte Joerg900.34
Heinrich Theodor Vierhaus1013923.57
Selimis Georgios1100.34
Dan Alexandrescu128712.69
Mottaqiallah Taouil1322433.40
Schrijen Geert-Jan1400.34
Jaan Raik1521151.77
Luca Sterpone1623341.54
Giovanni Squillero17992103.07
Zoya Dyka183215.61