Name
Title | ||
|---|---|---|
Ff-Control Point Insertion (Ff-Cpi) To Overcome The Degradation Of Fault Detection Under Multi-Cycle Test For Post |
Abstract | ||
|---|---|---|
Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1587/transinf.2019EDP7235 | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS |
Keywords | DocType | Volume |
POST, BIST, Multi-Cycle Test, Fault detection degradation, FF-Control Point Insertion technique, FF selection | Journal | E103D |
Issue | ISSN | Citations |
11 | 1745-1361 | 0 |
PageRank | References | Authors |
0.34 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hanan T. Al-AWADHI | 1 | 0 | 0.34 |
| Tomoki Aono | 2 | 0 | 0.34 |
| Senling Wang | 3 | 18 | 5.91 |
| Yoshinobu Higami | 4 | 140 | 27.24 |
| H. Takahashi | 5 | 18 | 3.94 |
| Hiroyuki Iwata | 6 | 7 | 2.92 |
| Yoichi Maeda | 7 | 13 | 5.96 |
| Jun Matsushima | 8 | 13 | 4.09 |