Name
Abstract | ||
|---|---|---|
Test compaction and the associated test data compression are two key components of the post-production test as they reduce test pattern counts, the resultant test data volume, test application time, and hence the cost of testing. The paper describes a method that strives to reduce the number of ATPG-produced deterministic test patterns to deliver compact test sets. In principle, it is based on a d... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/ITC50571.2021.00035 | 2021 IEEE International Test Conference (ITC) |
Keywords | DocType | ISSN |
ATPG,dimensionality reduction,necessary assignments,static test compaction,scan-based designs,test compression | Conference | 1089-3539 |
ISBN | Citations | PageRank |
978-1-6654-1695-5 | 1 | 0.38 |
References | Authors | |
0 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Stephan Eggersglüß | 1 | 1 | 0.38 |
| Sylwester Milewski | 2 | 3 | 3.12 |
| Janusz Rajski | 3 | 2460 | 201.28 |
| Jerzy Tyszer | 4 | 838 | 74.98 |