G.J. Papaioannou - Citegraph

Author Info

Name	Affiliation	Papers
G.J. PAPAIOANNOU	Physics Department, National and Kapodistrian University of Athens, Athens 15784, Greece	13
Collaborators	Citations	PageRank
40	14	8.35
Referers	Referees	References
53	79	21

Publications (13 rows)

Collaborators (40 rows)

Referers (53 rows)

Referees (79 rows)

Title	Citations	PageRank	Year
Temperature accelerated discharging processes through the bulk of PECVD silicon nitride films for MEMS capacitive switches.	0	0.34	2017
Electrical properties of SiNx films with embedded CNTs for MEMS capacitive switches.	0	0.34	2017
Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness.	0	0.34	2016
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress	0	0.34	2010
Accelerated lifetime test of RF-MEMS switches under ESD stress	4	0.99	2009
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs	1	0.39	2009
ESD failure signature in capacitive RF MEMS switches	2	1.32	2008
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique	0	0.34	2008
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques	1	0.48	2007
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors	1	0.41	2007
Charging of radiation induced defects in RF MEMS dielectric films	3	1.58	2006
The impact of static and dynamic degradation on SOI “smart-cut” floating body MOSFETs	0	0.34	2005
Investigation of charging mechanisms in metal-insulator-metal structures	2	1.15	2005

1