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F. PALUMBO
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Name
Affiliation
Papers
F. PALUMBO
CONICET CNEA, RA-1650 Buenos Aires, DF, Argentina
9
Collaborators
Citations
PageRank
47
5
3.72
Referers
Referees
References
9
75
19
Publications (9 rows)
Collaborators (47 rows)
Referers (9 rows)
Referees (75 rows)
Title
Citations
PageRank
Year
Spatio-Temporal Defect Generation Process in Irradiated HfO<inf>2</inf> MOS Stacks: Correlated Versus Uncorrelated Mechanisms
0
0.34
2019
Performance-reliability trade-offs in short range RF power amplifier design.
0
0.34
2018
Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks.
0
0.34
2016
General features of progressive breakdown in gate oxides: A compact model
1
0.43
2015
A Dual Core Low Power Microcontroller With Openmsp430 Architecture For High Reliability Lockstep Applications Using A 180 Nm High Voltage Technology Node
0
0.34
2013
Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam
0
0.34
2013
Radiation effects in nitride read-only memories
0
0.34
2010
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks
3
0.73
2008
Structure of the oxide damage under progressive breakdown
1
0.52
2005
1