Name
Abstract | ||
|---|---|---|
This paper proposes a new method for directly measuring alias-free aperture jitter in an ADC output. Both the average ENOB and the worst-case ENOB due to aperture jitter are also measured after the elimination of the aliasing noise. Because it adds only a negligible computation time to an existing ENOB test of a single frequency, it can also be used in an HV production environment and should reduce the overall test time by at least three times. |
Year | DOI | Venue |
|---|---|---|
2015 | 10.1109/TEST.2015.7342384 | International Test Conference |
Field | DocType | ISSN |
Aperture,Alias,Noise measurement,Computer science,Signal-to-noise ratio,Effective number of bits,Real-time computing,Electronic engineering,Aliasing,Amplitude modulation,Jitter | Conference | 1089-3539 |
Citations | PageRank | References |
0 | 0.34 | 6 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Takahiro J. Yamaguchi | 1 | 176 | 35.24 |
| Katsuhiko Degawa | 2 | 17 | 5.30 |
| Masayuki Kawabata | 3 | 17 | 4.61 |
| Masahiro Ishida | 4 | 105 | 22.58 |
| Koichiro Uekusa | 5 | 11 | 2.35 |
| Mani Soma | 6 | 497 | 73.41 |