Mayank Shrivastava

Author Info

Name	Affiliation	Papers
MAYANK SHRIVASTAVA	Indian Institute of Technology, Kharagpur, India	21
Collaborators	Citations	PageRank
60	2	7.22
Referers	Referees	References
4	121	35

Search Limit

100121

Publications (21 rows)

Collaborators (60 rows)

Referers (4 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap Engineering in Fin Based SCRs	0	0.34	2020
Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress	0	0.34	2020
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices	0	0.34	2020
First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS 2 Channel	0	0.34	2020
How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts	0	0.34	2020
Threshold Voltage Shift in a-Si:H Thin film Transistors under ESD stress Conditions	0	0.34	2020
Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight	0	0.34	2020
Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability	0	0.34	2019
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities	0	0.34	2019
First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects	0	0.34	2019
Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior	0	0.34	2019
Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability	0	0.34	2018
On the ESD behavior of a-Si:H based thin film transistors: Physical insights, design and technological implications	0	0.34	2018
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs	0	0.34	2018
Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs	0	0.34	2018
On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs	0	0.34	2018
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete?	0	0.34	2017
ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis	0	0.34	2017
A Systematic Study on the Hysteresis Behaviour and Reliability of MoS2 FET	0	0.34	2017
A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package	0	0.34	2016
Two-stream indexing for spoken web search	2	0.46	2011