Author Info
Name
Affiliation
Papers
L. BOUDOU
University of Toulouse LAPLACE, 118, route de Narbonne, 31077 Toulouse, France
3
Collaborators
Citations 
PageRank 
12
17
6.55
Referers 
Referees 
References 
47
26
5
Title
Citations
PageRank
Year
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation102.062008
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches20.642008
Charging-Effects in RF capacitive switches influence of insulating layers composition53.852006