Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes | 3 | 0.41 | 2007 |
| Scan Tests with Multiple Fault Activation Cycles for Delay Faults | 16 | 0.90 | 2006 |
| On generating pseudo-functional delay fault tests for scan designs | 51 | 2.18 | 2005 |