Paper Info
Title
Predictive error detection by on-line aging monitoring
Abstract
The purpose of this paper is to present a predictive error detection methodology, based on monitoring of long-term performance degradation of semiconductor systems. Delay variation is used to sense timing degradation due to aging (namely, due to NBTI), or to physical defects activated by long lifetime operation, which may occur in safety-critical systems (automotive, health, space). Error is prevented by detecting critical paths abnormal (but not fatal) propagation delays. A monitoring procedure and a programmable aging sensor are proposed. The sensor is selectively inserted in key locations in the design and can be activated either on user's requirement, or at pre-defined situations (e.g., at power-up). The sensor is optimized to exhibit low sensitivity to PVT (Process, power supply Voltage and Temperature) variations. Sensor limitations are analysed. A new sensor architecture and a sensor insertion algorithm are proposed. Simulation results are presented with a ST 65 nm sensor design.
Year
DOI
Venue
2010
10.1109/IOLTS.2010.5560241
IOLTS
Keywords
Field
DocType
sensor insertion algorithm,new sensor architecture,predictive error detection,sensor limitation,critical path,sense timing degradation,programmable aging sensor,on-line aging monitoring,monitoring procedure,long-term performance degradation,nm sensor design,predictive error detection methodology,prediction error,aging,error detection,sensors,propagation delay,sensitivity,degradation,process variation
Propagation delay,Computer science,Voltage,Degradation (geology),Electronic engineering,Monitoring procedure,Error detection and correction,Real-time computing,Automotive industry
Conference
ISBN
Citations 
PageRank 
978-1-4244-7724-1
5
0.57
References 
Authors
0
8
Name
Order
Citations
PageRank
J. C. Vazquez1201.64
Champac, V.2201.64
A. M. Ziesemer350.57
Ricardo A. L. Reis421748.75
Jorge Semião55712.11
I. C. Teixeira616320.29
M. B. Santos7676.87
J. P. Teixeira8565.80