Paper Info
Title
New Class of Tests for Open Faults with Considering Adjacent Lines
Abstract
Under the open fault model with considering the effects of adjacent lines, the open fault excitation is depended on the tests. Therefore, the layout information is needed to generate a test for an open fault. However, it is not easy to extract accurate circuit parameters of a deep sub-micron LSI. We have already proposed an open fault model without using the accurate circuit parameters \cite{yanagi09, yamazaki09, tsume08}.In this paper, we propose a new class of the pair of tests for the open fault called Ordered Pair of Tests (OPT). OPT is generated based on the fault excitation function as a threshold function of the adjacent lines. Also we propose a method for generating OPTs from the given stuck-at fault test set. The proposed method generates OPTs using only information about adjacent lines of the target open fault. Experimental results show that the proposed method can generate the OPTs for the open faults with high fault coverage.
Year
DOI
Venue
2009
10.1109/ATS.2009.39
Asian Test Symposium
Keywords
Field
DocType
new class,adjacent line,open fault,high fault coverage,open faults,target open fault,open fault excitation,accurate circuit parameter,open fault model,adjacent lines,stuck-at fault test set,fault excitation function,computational modeling,data mining,logic gates,fault model,cmos technology,fault coverage,mathematical model
Stuck-at fault,Logic gate,Fault coverage,Computer science,Ordered pair,CMOS,Real-time computing,Electronic engineering,Fault model,Fault indicator,Test set
Conference
ISSN
Citations 
PageRank 
1081-7735
2
0.38
References 
Authors
12
7
Name
Order
Citations
PageRank
Hiroshi Takahashi114824.32
Yoshinobu Higami214027.24
Yuzo Takamatsu315027.40
Koji Yamazaki4278.41
Toshiyuki Tsutsumi5597.28
Hiroyuki Yotsuyanagi67019.04
Masaki Hashizume79827.83