Name
Title | ||
|---|---|---|
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment |
Abstract | ||
|---|---|---|
For many years, non-target detection experiments have been simulated by using AND/OR bridges or gross delay faults as surrogates. For example, the defective part level can be estimated based upon surrogate detection when test patterns target stuck-at faults in the circuit. For the first time, test pattern generation techniques that attempt to maximize non-target defect detection have been used to test a real, 100% scanned, commercial chip consisting of 75K logic gates. In this experiment, the defective part level for REDO-based patterns was 1,288 parts per million lower than that achieved by DC stuck-at based patterns generated using today's state of the art tools and techniques. |
Year | Venue | Keywords |
|---|---|---|
1999 | VTS | defective part level,art tool,redo-based pattern,deterministic observation,stuck-at fault,first commercial experiment,test pattern,surrogate detection,dc stuck-at,probabilistic excitation,non-target detection experiment,test pattern generation technique,non-target defect detection |
Field | DocType | ISBN |
Logic gate,Pattern generation,Computer science,Electronic engineering,Chip,Excitation,Probabilistic logic | Conference | 0-7695-0146-X |
Citations | PageRank | References |
25 | 2.94 | 8 |
Authors | ||
11 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Michael R. Grimaila | 1 | 264 | 29.53 |
| Sooryong Lee | 2 | 87 | 7.63 |
| Jennifer Dworak | 3 | 132 | 11.63 |
| Kenneth M. Butler | 4 | 755 | 64.77 |
| Bret Stewart | 5 | 58 | 5.02 |
| Hari Balachandran | 6 | 192 | 17.53 |
| Bryan Houchins | 7 | 25 | 2.94 |
| Vineet Mathur | 8 | 25 | 2.94 |
| Jaehong Park | 9 | 919 | 87.01 |
| Li-C. Wang | 10 | 201 | 17.53 |
| M. Ray Mercer | 11 | 679 | 108.73 |