Title
A 45nm Soi Compiled Embedded Dram With Random Cycle Times Down To 1.3ns
Abstract
A family of embedded DRAMs which are fabricated in 45nm SOI technology is presented. The fast eDRAM has 64 b/BL and achieves a random cycle time of 1.3ns for V-DD = 1.00V and typical process. The dense eDRAM has 128 b/BL and operates in multi-bank modes up to 1.67GHz for V-DD = 1.0V and nominal process. The staggered - folded BL architecture with BL twisting over both the array and SAs is described as well as a novel wordline timer which generates a 75% duty cycle signal from a 50% duty cycle clock.
Year
DOI
Venue
2010
10.1109/CICC.2010.5617634
IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE 2010
Keywords
Field
DocType
silicon on insulator,cycle time,duty cycle,capacitance,embedded systems,capacitors,random processes
Dram,Silicon on insulator,Capacitor,Capacitance,Computer science,Duty cycle,Stochastic process,Electronic engineering,eDRAM,Timer
Conference
Citations 
PageRank 
References 
2
0.44
6
Authors
11
Name
Order
Citations
PageRank
Mark Jacunski120.78
Darren Anand2153.01
Robert Busch320.44
J. A. Fifield4184.35
Matthew Lanahan520.44
Paul Lane620.44
Adrian Paparelli750.91
Gary Pomichter8121.90
Dale Pontius920.78
Michael Roberge1051.59
Stephen Sliva1150.91