Paper Info
Title
Blind Adaptive Estimation of Integral Nonlinear Errors in ADCs Using Arbitrary Input Stimulus
Abstract
An adaptive digital test procedure for the static characterization of analog-to-digital converters (ADCs) is described in this paper. The proposed technique performs a blind and accurate estimation of the integral nonlinearity (INL) of the ADC under test (ADCUT) without requiring any particular test stimulus. Its practical implementation implies no modifications on the ADCUT analog section and needs a very simple low-cost digital logic, which makes this useful for: 1) simple digital automatic test equipment (ATE)-based ADC static test and 2) built-in self-test (BIST) for ADCs test working either in concurrent (online) or nonconcurrent (offline) modes. The validation of these test methods has been performed through realistic behavioral simulations including noise, mismatch, and nonlinear errors. Experimental results for a custom-designed pipeline ADC and for the commercial AD664 chip are also reported.
Year
DOI
Venue
2011
10.1109/TIM.2010.2051062
Instrumentation and Measurement, IEEE Transactions
Keywords
Field
DocType
adaptive estimation,adaptive signal processing,analogue-digital conversion,automatic test equipment,built-in self test,ADC under test,ADCUT,analog-to-digital converters,blind adaptive estimation,built-in self-test,digital automatic test equipment,integral nonlinear errors,integral nonlinearity,Analog-to-digital converter (ADC) static characterization,built-in self-test (BIST),digital adaptive blind test,integral nonlinearity ( $INL$),online testing
Flight dynamics (spacecraft),Integral nonlinearity,Nonlinear system,Computer science,Automatic test equipment,Chip,Electronic engineering,Adaptive filter,Successive approximation ADC,Built-in self-test
Journal
Volume
Issue
ISSN
60
2
0018-9456
Citations 
PageRank 
References 
3
0.53
14
Authors
3
Name
Order
Citations
PageRank
Antonio J. Ginés1177.43
Eduardo J. Peralías25816.71
Adoración Rueda327540.01