Name
Title | ||
|---|---|---|
Soft Error Detection and Correction Technique for Radiation Hardening Based on C-element and BICS. |
Abstract | ||
|---|---|---|
Higher density of integration and lower power technologies are becoming more sensitive to soft errors caused by radiations. Not only memories and latches are being affected but also combinatorial circuits. Hardening by design techniques based on increasing the amount of charge representing the bit and redundancy techniques have been used over the years. However, what happens if the hardening is affected? Who guards the guardians? This brief proposes a system that acts as a single-event transient (SET) filter and as a checkpoint with self-healing properties to prevent SET propagation. This is achieved due to feedback using bulk built-in current sensors. |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1109/TCSII.2014.2356911 | IEEE Trans. on Circuits and Systems |
Keywords | Field | DocType |
Bulk built-in current sensors (BICS), C-element, cosmic rays, critical charge, single-event transient (SET), single-event upset (SEU), soft error, temporal filtering | Soft error,Hardening (computing),Electronic engineering,Redundancy (engineering),Soft error detection,Electronic circuit,Critical charge,Radiation hardening,Electrical engineering,Mathematics,C-element | Journal |
Volume | Issue | ISSN |
61-II | 12 | 1549-7747 |
Citations | PageRank | References |
5 | 0.53 | 5 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Daniel Gomez Toro | 1 | 5 | 0.53 |
| Matthieu Arzel | 2 | 69 | 15.10 |
| Fabrice Seguin | 3 | 36 | 16.02 |
| Michel Jézéquel | 4 | 769 | 84.23 |