Title
A 32 kb 0.35-1.2 V, 50 MHz-2.5 GHz Bit-Interleaved SRAM With 8 T SRAM Cell and Data Dependent Write Assist in 28-nm UTBB-FDSOI CMOS.
Abstract
An optimized co-design of SRAM cell, assist schemes, and layout is proposed to achieve wide voltage range operation of SRAM from 0.35-1.2 V at all process corners. A differential read asymmetric 8 T memory cell and a data dependent differential supply and body modulation write assist scheme are proposed. We also propose a layout that reduces metal capacitance of wordlines by 54% and also enables b...
Year
DOI
Venue
2017
10.1109/TCSI.2017.2705116
IEEE Transactions on Circuits and Systems I: Regular Papers
Keywords
Field
DocType
SRAM cells,Low voltage,Circuit stability,Layout,Logic gates
Logic gate,Capacitance,Process corners,Computer science,Voltage,Electronic engineering,CMOS,Static random-access memory,Low voltage,Memory cell
Journal
Volume
Issue
ISSN
64
9
1549-8328
Citations 
PageRank 
References 
2
0.40
9
Authors
13