Name
Abstract | ||
|---|---|---|
With exponential development in the semiconductor technology in recent years, the magnitudes of test power consumption and test data volumes have increased significantly. This has resulted in over-testing because of IR drops. This paper proposes a reconfigurable scan architecture to overcome these challenges. The proposed architecture increases the flexibility of the scan partitioning technique to maximize the reduction in the switching activity, and it uses the scan segment skip technique to reduce the data volume. The results show that our method is able to achieve significant reductions in the total test power and data volumes compared with previous methods. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1587/elex.14.20170415 | IEICE ELECTRONICS EXPRESS |
Keywords | Field | DocType |
reconfigurable scan architecture, test data volume, low power test | Computer architecture,Architecture,Computer science,Volume reduction,Electronic engineering,Test power | Journal |
Volume | Issue | ISSN |
14 | 13 | 1349-2543 |
Citations | PageRank | References |
0 | 0.34 | 6 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hyunggoy Oh | 1 | 14 | 4.80 |
| Heetae Kim | 2 | 2 | 3.20 |
| Jaeil Lim | 3 | 10 | 3.69 |
| Sungho Kang | 4 | 436 | 78.44 |