Name
Abstract | ||
|---|---|---|
Although the near threshold voltage (NTV) design has achieved energy efficiency, certain challenges remain regarding its application. In this paper, we describe the analysis of thermally induced reliability concern in test process. In an NTV environment, the thermal dependency of a circuit delay is changed, and a difference in thermal constraints from that in a nominal voltage design exists. In ad... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TCAD.2017.2729282 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | Field | DocType |
Delays,Testing,Power dissipation,Integrated circuit reliability,Circuit faults,Robustness | Thermal,Computer science,Efficient energy use,Dissipation,Voltage,Test scheduling,Robustness (computer science),Electronic engineering,Real-time computing,Electronic circuit,Threshold voltage,Reliability engineering | Journal |
Volume | Issue | ISSN |
37 | 4 | 0278-0070 |
Citations | PageRank | References |
2 | 0.49 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jaeil Lim | 1 | 10 | 3.69 |
| Hyunggoy Oh | 2 | 14 | 4.80 |
| Heetae Kim | 3 | 2 | 3.20 |
| Sungho Kang | 4 | 436 | 78.44 |