Name
Abstract | ||
|---|---|---|
This paper proposes a X-filling method that reduces capture power during scan-based testing. The proposed method classifies scan cells for dividing the scan cells into some groups. Then, based on the divided groups, X-bits are filled simultaneously to reduce the computation time. Since the proposed method uses a novel grouping algorithm and fills X-bits based on groups, the proposed method reduces switching activity and computation time when compared with conventional X-filling methods. The simulation results show that the proposed method reduces the switching activity up to 70% and the number of simulations for the X-filling up to 52% compared with that of conventional X-filling methods. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1587/elex.14.20171093 | IEICE ELECTRONICS EXPRESS |
Keywords | Field | DocType |
X-filling, low power test, capture power reduction | Computer science,Electronic engineering | Journal |
Volume | Issue | ISSN |
14 | 23 | 1349-2543 |
Citations | PageRank | References |
0 | 0.34 | 7 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Heetae Kim | 1 | 2 | 3.20 |
| Hyunggoy Oh | 2 | 14 | 4.80 |
| Jaeil Lim | 3 | 10 | 3.69 |
| Sungho Kang | 4 | 436 | 78.44 |