Paper Info
Title
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator
Abstract
Process variability and time-dependent variability have become major concerns in deeply-scaled technologies. Two of the most important time-dependent variability phenomena are Bias Temperature Instability (BTI) and Hot-Carrier Injection (HCI), which can critically shorten the lifetime of circuits. Both BTI and HCI reveal a discrete and stochastic behavior in the nanometer scale, and, while process variability has been extensively treated, there is a lack of design methodologies that address the joint impact of these two phenomena on circuits. In this work, an automated and time-efficient design methodology that takes into account both process and time-dependent variability is presented. This methodology is based on the utilization of lifetime-aware Pareto-Optimal Fronts (POFs). The POFs are generated with a multi-objective optimization algorithm linked to a stochastic simulator. Both the optimization algorithm and the simulator have been specifically tailored to reduce the computational cost of the accurate evaluation of the impact on a circuit of both sources of variability.
Year
DOI
Venue
2019
10.23919/DATE.2019.8714784
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Keywords
Field
DocType
Reliability,Aging,BTI,HCI,Lifetime,Simulation,Optimization,Pareto front
Mathematical optimization,Computer science,Real-time computing,Pareto optimal
Conference
ISSN
ISBN
Citations 
1530-1591
978-1-7281-0331-0
0
PageRank 
References 
Authors
0.34
9
10
Name
Order
Citations
PageRank
A. Toro-Frias1173.59
P. Saraza-Canflanca211.79
Fábio Passos3197.41
P. Martín-Lloret4154.01
R. Castro-López57918.20
Elisenda Roca612926.84
Javier Martín-Martínez74813.91
Rosana Rodríguez8104.79
Montserrat Nafría9235.27
Francisco V. Fernández1023440.82