Author Info
Name
Affiliation
Papers
ALEXANDRE SARAFIANOS
CEA TECH, Dept Syst & Architectures Securises SAS, Gardanne, France
12
Collaborators
Citations 
PageRank 
30
68
6.96
Referers 
Referees 
References 
147
94
57
Search Limit
100147
Title
Citations
PageRank
Year
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation30.512015
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology10.432015
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents80.592015
Influence of triple-well technology on laser fault injection and laser sensor efficiency10.372015
Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses70.712015
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation10.352015
Laser attacks on integrated circuits: From CMOS to FD-SOI40.522014
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.130.712014
Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells161.022013
Robustness improvement of an SRAM cell against laser-induced fault injection40.582013
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell.100.822013
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology.00.342012