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F. COCCETTI
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Name
Affiliation
Papers
F. COCCETTI
CNRS, LAAS, 7 Avenue du colonel Roche, F-31400 Toulouse, France
12
Collaborators
Citations
PageRank
49
40
11.42
Referers
Referees
References
94
74
21
Publications (12 rows)
Collaborators (49 rows)
Referers (94 rows)
Referees (74 rows)
Title
Citations
PageRank
Year
Large electromagnetic simulation by hybrid approach on large‐scale parallel computing systems
1
0.34
2015
Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process.
0
0.34
2013
Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS.
1
0.63
2012
Large electromagnetic problem on large scale parallel computing systems
1
0.37
2012
Life expectancy and characterization of capacitive RF MEMS switches
4
0.49
2010
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques
6
1.14
2010
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions
9
1.82
2009
Accelerated lifetime test of RF-MEMS switches under ESD stress
4
0.99
2009
ESD failure signature in capacitive RF MEMS switches
2
1.32
2008
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation
10
2.06
2008
Alpha particle radiation effects in RF MEMS capacitive switches
1
0.47
2008
Electrostatic discharge failure analysis of capacitive RF MEMS switches
1
1.46
2007
1