| Decomposition of drain-current variation into gain-factor and threshold voltage variations | 0 | 0.34 | 2010 |
| Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors | 2 | 0.54 | 2009 |
| Physical Design Challenges To Nano-Cmos Circuits | 1 | 0.37 | 2009 |
| Determination of optimal polynomial regression function to decompose on-die systematic and random variations | 5 | 0.43 | 2008 |
| An Evaluation Method of the Number of Monte Carlo STA Trials for Statistical Path Delay Analysis | 2 | 0.41 | 2008 |
| Non-parametric statistical static timing analysis: an SSTA framework for arbitrary distribution | 6 | 0.49 | 2008 |
| Layout-Aware Compact Model Of Mosfet Characteristics Variations Induced By Sti Stress | 3 | 0.75 | 2008 |
| A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation | 1 | 0.41 | 2007 |
| 1/F-Noise Characteristics In 100 Nm-Mosfets And Its Modeling For Circuit Simulation | 0 | 0.34 | 2005 |
| A Compact Model Of The Pinch-Off Region Of 100 Nm Mosfets Based On The Surface-Potential | 0 | 0.34 | 2005 |
| Circuit Simulation Models For Coming Mosfet Generations | 0 | 0.34 | 2002 |
| On discrete random dopant modeling in drift-diffusion simulations: physical meaning of `atomistic' dopants | 5 | 1.08 | 2002 |
| Correlation method of circuit-performance and technology fluctuations for improved design reliability | 1 | 0.39 | 2001 |
| Numerical simulation of neuronal population coding: influences of noise and tuning width on the coding error. | 4 | 2.73 | 1995 |
