Paper Info
Title
Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines
Abstract
In order to ensure high quality of DSM circuits, testing for the open defect in the circuits is necessary. However, the modeling and techniques for test generation for open faults have not been established yet. In this paper, we propose a method for generating tests and diagnostic tests based on a new open fault model. Firstly, we show a new open fault model with considering adjacent lines [9]. Under the open fault model, we reveal more about the conditions to excite the open fault. Next we propose a method for generating tests for open faults by using a stuck-at fault test with don't cares. We also propose a method for generating a diagnostic test that can distinguish the pair of open faults. Finally, experimental results show that 1) the proposed method is able to achieve 100% fault coverages for almost all benchmark circuits and 2) the proposed method is able to reduce the number of indistinguished open fault pairs.
Year
DOI
Venue
2007
10.1109/DFT.2007.11
DFT
Keywords
Field
DocType
diagnostic test,indistinguished open fault pair,open fault model,open defect,diagnostic test generation,open fault,open faults,new open fault model,test generation,adjacent lines,stuck-at fault test,fault coverage
Stuck-at fault,Automatic test pattern generation,Fault coverage,Computer science,Circuit reliability,Electronic engineering,Fault (power engineering),Electronic circuit,Fault model,Fault indicator
Conference
ISSN
ISBN
Citations 
1550-5774
0-7695-2885-6
5
PageRank 
References 
Authors
0.49
8
9
Name
Order
Citations
PageRank
Hiroshi Takahashi114824.32
Yoshinobu Higami214027.24
Toru Kikkawa350.49
Takashi Aikyo49311.46
Yuzo Takamatsu515027.40
Koji Yamazaki6278.41
Toshiyuki Tsutsumi7597.28
Hiroyuki Yotsuyanagi87019.04
Masaki Hashizume99827.83