Name
Abstract | ||
|---|---|---|
With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis [1]. In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1093/ietisy/e91-d.3.771 | IEICE Transactions |
Keywords | Field | DocType |
production testing,built-in self test,fault diagnosis,post-bist fault diagnosis,increasing complexity,present paper,effective method,multiple stuck-at fault,multiple faults,ambiguous test pattern,large circuit,combinational circuits,combinational circuit,pass | Logic gate,Fault coverage,Production testing,Computer science,Combinational logic,Artificial intelligence,Self test,Integrated circuit,Built-in self-test,Stuck-at fault,Pattern recognition,Reliability engineering,Embedded system | Journal |
Volume | Issue | ISSN |
E91-D | 3 | 1745-1361 |
Citations | PageRank | References |
0 | 0.34 | 6 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hiroshi Takahashi | 1 | 148 | 24.32 |
| Yoshinobu Higami | 2 | 140 | 27.24 |
| Shuhei Kadoyama | 3 | 1 | 0.72 |
| Yuzo Takamatsu | 4 | 150 | 27.40 |
| Koji Yamazaki | 5 | 27 | 8.41 |
| Takashi Aikyo | 6 | 93 | 11.46 |
| Yasuo Sato | 7 | 38 | 4.46 |