Author Info
Name
Affiliation
Papers
SUBARNA SINHA
Synopsys Inc, Mountain View, CA 94043 USA
22
Collaborators
Citations 
PageRank 
47
198
20.80
Referers 
Referees 
References 
391
395
193
Search Limit
100395
Title
Citations
PageRank
Year
Improved Tangent Space-Based Distance Metric for Lithographic Hotspot Classification.10.352017
Deciphering cancer biology using boolean methods00.342016
Fast and scalable parallel layout decomposition in double patterning lithography20.422014
Comparative Improvement of Image Segmentation Performance with Graph Based Method over Watershed Transform Image Segmentation00.342014
Graph Coloring Problem Solution Using Modified Flocking Algorithm00.342013
Accurate process-hotspot detection using critical design rule extraction251.192012
Improved tangent space based distance metric for accurate lithographic hotspot classification150.922012
A Hierarchy-Based Distributed Algorithm for Layout Geometry Operations10.352012
A distributed algorithm for layout geometry operations00.342011
Fixed-outline thermal-aware 3D floorplanning150.702010
Sequential logic rectifications with approximate SPFDs00.342009
The road to 3D EDA tool readiness161.712009
Efficient range pattern matching algorithm for process-hotspot detection111.072008
A methodology for fast and accurate yield factor estimation during global routing10.362007
A New Flexible Algorithm for Random Yield Improvement10.372007
Model Based Layout Pattern Dependent Metal Filling Algorithm for Improved Chip Surface Uniformity in the Copper Process160.892007
Fast and Efficient Bright-Field AAPSM Conflict Detection and Correction70.722007
Accurate detection for process-hotspots with vias and incomplete specification221.772007
Efficient Process-Hotspot Detection Using Range Pattern Matching211.882006
Using simulation and satisfiability to compute flexibilities in Boolean networks211.222006
An IC manufacturing yield model considering intra-die variations140.972006
Bright-field AAPSM conflict detection and correction94.212005