Author Info
Name
Affiliation
Papers
M. LAMHAMDI
University of Toulouse LAAS CNRS, 7, avenue du Colonel Roche, 31077 Toulouse, France
6
Collaborators
Citations 
PageRank 
21
28
11.09
Referers 
Referees 
References 
54
39
13
Title
Citations
PageRank
Year
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation102.062008
Alpha particle radiation effects in RF MEMS capacitive switches10.472008
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches20.642008
Structure dependent charging process in RF MEMS capacitive switches72.492007
Charging of radiation induced defects in RF MEMS dielectric films31.582006
Charging-Effects in RF capacitive switches influence of insulating layers composition53.852006