Author Info
Name
Affiliation
Papers
Z. H. MAI
GLOBALFOUNDRIES Singapore Pte. Ltd.60 Woodlands Industrial Park D Street 2738406Singapore
12
Collaborators
Citations 
PageRank 
66
1
4.34
Referers 
Referees 
References 
10
16
3
Title
Citations
PageRank
Year
Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique.00.342018
Failure analysis on 14 nm FinFET devices with ESD CDM failure.00.342018
Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect.00.342017
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.00.342017
In-depth circuits edit analysis to reveal the implantation-related defect.00.342017
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.00.342017
Static fault localization of subtle metallization defects using near infrared photon emission microscopy.10.632017
Cross-sectional nanoprobing fault isolation technique on submicron devices.00.342016
Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system.00.342016
Electrical analysis on implantation-related defect by nanoprobing methodology.00.342016
Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue.00.342016
Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique00.342015