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E. ZANONI
Author Info
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Name
Affiliation
Papers
E. ZANONI
University of Padova, Department of Information Engineering, Via Gradenigo 6/B, 35100 Padova, Italy
12
Collaborators
Citations
PageRank
59
13
7.01
Referers
Referees
References
55
6
2
Publications (12 rows)
Collaborators (59 rows)
Referers (55 rows)
Referees (6 rows)
Title
Citations
PageRank
Year
<tex>$\mu s$</tex>-Range Evaluation of Threshold Voltage Instabilities of GaN-on-Si HEMTs with p-GaN Gate
0
0.34
2019
Hot-Electron Effects in GaN GITs and HD-GITs: A Comprehensive Analysis
0
0.34
2019
Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability
0
0.34
2019
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields
1
0.62
2008
Holding voltage investigation of advanced SCR-based protection structures for CMOS technology
2
0.53
2007
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors
0
0.34
2006
DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure FETs: performance and reliability issues
2
1.42
2005
Reliability of visible GaN LEDs in plastic package
6
1.37
2003
Optimization of ESD protection structures suitable for BCD6 smart power technology
0
0.34
2003
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology
0
0.34
2002
Long Term Stability of InGaAs/AlInAs/GaAs Methamorphic HEMTs
1
0.56
2001
ESD protection structures for BCD5 smart power technologies.
1
0.48
2001
1