Author Info
Name
Affiliation
Papers
P. PONS
LAAS-CNRS, 7 avenue Roche, 31077 Toulouse Cedex 04, France
15
Collaborators
Citations 
PageRank 
68
49
18.02
Referers 
Referees 
References 
97
43
18
Title
Citations
PageRank
Year
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques61.142010
Methods to improve reliability of bulge test technique to extract mechanical properties of thin films00.342010
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions91.822009
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation102.062008
Alpha particle radiation effects in RF MEMS capacitive switches10.472008
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches20.642008
Structure dependent charging process in RF MEMS capacitive switches72.492007
Charging of radiation induced defects in RF MEMS dielectric films31.582006
Charging-Effects in RF capacitive switches influence of insulating layers composition53.852006
Investigation of charging mechanisms in metal-insulator-metal structures21.152005
Thermal and electrostatic reliability characterization in RF MEMS switches20.542005
Biaxial initial stress characterization of bilayer gold RF-switches10.752005
Smart MEMS concept for high secure RF and millimeterwave communications00.342004
Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling.10.512003
Performances and potentialities of a very simple self-compensated pressure sensor demonstrator00.341999