Name
Affiliation
Papers
MASANORI HASHIMOTO
Osaka University, Osaka, Japan
158
Collaborators
Citations 
PageRank 
209
462
79.39
Referers 
Referees 
References 
966
1555
942
Search Limit
1001000
Title
Citations
PageRank
Year
DC Magnetic Field-Based Analytical Localization Robust to Known Stationary Magnetic Object00.342022
Via-Switch FPGA: 65-nm CMOS Implementation and Evaluation00.342022
Low-Power Design Methodology of Voltage Over-Scalable Circuit with Critical Path Isolation and Bit-Width Scaling00.342022
Activation-Aware Slack Assignment Based Mode-Wise Voltage Scaling for Energy Minimization00.342022
Estimating Vulnerability of All Model Parameters in DNN with a Small Number of Fault Injections00.342022
Minimizing Energy of DNN Training with Adaptive Bit-width and Voltage Scaling00.342021
When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies00.342020
Low-Cost Reservoir Computing using Cellular Automata and Random Forests00.342020
Proactive Supply Noise Mitigation with Low-Latency Minor Voltage Regulator and Lightweight Current Prediction00.342020
Minimizing Power for Neural Network Training with Logarithm-Approximate Floating-Point Multiplier00.342019
Distilling Knowledge for Non-Neural Networks00.342019
Mttf-Aware Design Methodology Of Adaptively Voltage Scaled Circuit With Timing Error Predictive Flip-Flop00.342019
An Analytic Evaluation On Soft Error Immunity Enhancement Due To Temporal Triplication00.342018
Activation-Aware Slack Assignment for Time-to-Failure Extension and Power Saving.10.352018
MTTF-aware design methodology of error prediction based adaptively voltage-scaled circuits.10.362018
Hardware Architecture For High-Speed Object Detection Using Decision Tree Ensemble10.402018
Comparing voltage adaptation performance between replica and in-situ timing monitors00.342018
Sneak path free reconfiguration of via-switch crossbars based FPGA00.342018
Interconnect Delay Analysis for RRAM Crossbar Based FPGA.00.342018
Contributions of SRAM, FF and combinational circuit to chip-level neutron-induced soft error rate: - Bulk vs. FD-SOI at 0.5 and 1.0V -00.342017
GPGPU-based Highly Parallelized 3D Node Localization for Real-Time 3D Model Reproduction.10.482017
Critical path isolation for time-to-failure extension and lower voltage operation.10.362016
Latch Clustering for Minimizing Detection-to-Boosting Latency Toward Low-Power Resilient Circuits.00.342016
A highly-dense mixed grained reconfigurable architecture with overlay crossbar interconnect using via-switch20.402016
Reliability, adaptability and flexibility in timing: Buy a life insurance for your circuits00.342016
Impact of package on neutron induced single event upset in 20 nm SRAM00.342015
An oscillator-based true random number generator with process and temperature tolerance00.342015
Performance Evaluation of Software-based Error Detection Mechanisms for Localizing Electrical Timing Failures under Dynamic Supply Noise10.372015
Reliability-configurable mixed-grained reconfigurable array compatible with high-level synthesis00.342015
Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design And Its Irradiation Testing30.542014
Comparative Evaluation Of Lifetime Enhancement With Fault Avoidance On Dynamically Reconfigurable Devices00.342014
Edge-Over-Erosion Error Prediction Method Based On Multi-Level Machine Learning Algorithm00.342014
Nbti Mitigation Method By Inputting Random Scan-In Vectors In Standby Time00.342014
A Process And Temperature Tolerant Oscillator-Based True Random Number Generator40.472014
Supply noise suppression by triple-well structure60.702013
Pvt-Induced Timing Error Detection Through Replica Circuits And Time Redundancy In Reconfigurable Devices20.432013
A Worst-Case-Aware Design Methodology for Noise-Tolerant Oscillator-Based True Random Number Generator With Stochastic Behavior Modeling60.642013
Signal-Dependent Analog-To-Digital Conversion Based On Minimax Sampling20.402013
Jitter amplifier for oscillator-based true random number generator30.532013
Field Slack Assessment For Predictive Fault Avoidance On Coarse-Grained Reconfigurable Devices00.342013
A 0.8-V 110-Na Cmos Current Reference Circuit Using Subthreshold Operation00.342013
Jitter Amplifier for Oscillator-Based True Random Number Generator.00.342013
Mixed-Grained Reconfigurable Architecture Supporting Flexible Reliability And C-Based Design00.342013
Real-Time Supply Voltage Sensor for Detecting/Debugging Electrical Timing Failures10.362013
Implementing Flexible Reliability in a Coarse-Grained Reconfigurable Architecture50.432013
Power Gating Implementation For Supply Noise Mitigation With Body-Tied Triple-Well Structure00.342012
Adaptive Performance Compensation With In-Situ Timing Error Predictive Sensors for Subthreshold Circuits261.322012
Stress Probability Computation For Estimating Nbti-Induced Delay Degradation10.372011
Power gating implementation for noise mitigation with body-tied triple-well structure10.362011
Device-parameter estimation with on-chip variation sensors considering random variability30.532011
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