Name
Affiliation
Papers
YU CAO
Arizona State University, Tempe, AZ
28
Collaborators
Citations 
PageRank 
101
329
29.78
Referers 
Referees 
References 
872
363
122
Search Limit
100872
Title
Citations
PageRank
Year
Impact of On-chip Interconnect on In-memory Acceleration of Deep Neural Networks10.362022
System-Level Benchmarking of Chiplet-based IMC Architectures for Deep Neural Network Acceleration00.342021
Robust Rram-Based In-Memory Computing In Light Of Model Stability00.342021
MNSIM 2.0: A Behavior-Level Modeling Tool for Memristor-based Neuromorphic Computing Systems30.442020
Deep Neural Network Training Accelerator Designs in ASIC and FPGA10.352020
Compact modeling and simulation of accelerated circuit aging00.342018
Algorithm and Hardware Design of Discrete-Time Spiking Neural Networks Based on Back Propagation with Binary Activations.20.362017
Duty cycle shift under static/dynamic aging in 28nm HK-MG technology10.352015
Mitigating Effects of Non-ideal Synaptic Device Characteristics for On-chip Learning120.672015
On-chip Sparse Learning with Resistive Cross-point Array Architecture30.402015
Exploring sub-20nm FinFET design with predictive technology models846.542012
Design benchmarking to 7nm with FinFET predictive technology models121.642012
Enhancing the Reliability of STT-RAM through Circuit and System Level Techniques70.822012
Workload-adaptive process tuning strategy for power-efficient multi-core processors20.412010
Workload-aware neuromorphic design of low-power supply voltage controller40.402010
Compact Modeling of a PD SOI MESFET for Wide Temperature Designs10.822009
Modeling of layout-dependent stress effect in CMOS design81.072009
Design rule optimization of regular layout for leakage reduction in nanoscale design71.032008
Reliable Systems on Unreliable Fabrics231.102008
Node Criticality Computation for Circuit Timing Analysis and Optimization under NBTI Effect151.102008
Modeling and analysis of non-rectangular gate for post-lithography circuit simulation242.392007
Rigorous extraction of process variations for 65nm CMOS design00.342007
An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology120.892007
A New Simulation Method for NBTI Analysis in SPICE Environment60.622007
An efficient method to identify critical gates under circuit aging975.042007
LOTUS: Leakage Optimization under Timing Uncertainty for Standard-cell designs20.502006
Sram Cell Optimization For Ultra-Low Power Standby20.792006
Statistical Leakage Minimization Of Digital Circuits Using Gate Sizing, Gate Length Biasing, And Threshold Voltage Selection00.342006