Name
Affiliation
Papers
RAJENDRA BISHNOI
Karlsruhe Inst Technol, D-76131 Karlsruhe, Germany
45
Collaborators
Citations 
PageRank 
69
132
19.64
Referers 
Referees 
References 
315
586
295
Search Limit
100586
Title
Citations
PageRank
Year
Mitigating Read Failures in STT-MRAM00.342020
Crossover-Aware Placement And Routing For Inkjet Printed Circuits00.342020
Approximate Spintronic Memories00.342020
Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects00.342020
A Compact Low-Voltage True Random Number Generator Based on Inkjet Printing Technology20.462020
Secure STT-MRAM Bit-Cell Design Resilient to Differential Power Analysis Attacks00.342020
A Universal Spintronic Technology based on Multifunctional Standardized Stack10.372020
A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit.00.342020
Predictive Modeling and Design Automation of Inorganic Printed Electronics00.342019
Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects00.342019
A Spintronics Memory PUF for Resilience Against Cloning Counterfeit20.392019
Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme10.362019
A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach00.342019
Compiler-Assisted and Profiling-Based Analysis for Fast and Efficient STT-MRAM On-Chip Cache Design00.342019
A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM30.422019
Variation-aware Fault Modeling and Test Generation for STT-MRAM00.342019
Inkjet-Printed True Random Number Generator Based On Additive Resistor Tuning00.342019
Reliable in-memory neuromorphic computing using spintronics.20.392019
Multi-Bit Non-Volatile Spintronic Flip-Flop00.342018
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications10.372018
VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration Tool.10.352018
Using Multifunctional Standardized Stack As Universal Spintronic Technology For Iot10.352018
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM50.452018
Spintronic normally-off heterogeneous system-on-chip design00.342018
Inkjet-Printed EGFET-Based Physical Unclonable Function - Design, Evaluation, and Fabrication.20.512018
A Cross-Layer Adaptive Approach For Performance And Power Optimization In Stt-Mram20.362018
Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM.00.342018
Parametric failure modeling and yield analysis for STT-MRAM00.342018
Architecting SOT-RAM Based GPU Register File00.342017
Design of Defect and Fault-Tolerant Nonvolatile Spintronic Flip-Flops.30.412017
Opportunistic write for fast and reliable STT-MRAM.00.342017
VAET-STT: A variation aware estimator tool for STT-MRAM based memories.20.462017
GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTack10.402017
A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing40.412016
Layout-based Modeling and Mitigation of Multiple Event Transients70.712016
Low-Power Multi-Port Memory Architecture based on Spin Orbit Torque Magnetic Devices.10.352016
Non-Volatile Non-Shadow flip-flop using Spin Orbit Torque for efficient normally-off computing20.392016
Normally-OFF STT-MRAM Cache with Zero-Byte Compression for Energy Efficient Last-Level Caches.00.342016
Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing.111.062016
Fault Tolerant Non-Volatile spintronic flip-flop10.362016
Self-Timed Read and Write Operations in STT-MRAM.30.402016
Evaluation of Hybrid Memory Technologies Using SOT-MRAM for On-Chip Cache Hierarchy291.242015
Read disturb fault detection in STT-MRAM180.922014
Avoiding unnecessary write operations in STT-MRAM for low power implementation170.702014
Asynchronous Asymmetrical Write Termination (AAWT) for a low power STT-MRAM100.632014